Journal article
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy
Abstract
A strain characterization technique in a Scanning Transmission Electron Microscope (STEM) called "STEM Moiré GPA" (SMG) emerged recently as an efficient method to map the deformation field on large field of views (up to few microns in length scale). The technique is based on the interference between the scanning grid of the STEM electron probe and the periodic lattice of a crystalline material. The interference pattern (STEM Moiré hologram) is …
Authors
Pofelski A; Ghanad-Tavakoli S; Thompson DA; Botton GA
Journal
Ultramicroscopy, Vol. 209, ,
Publisher
Elsevier
Publication Date
February 2020
DOI
10.1016/j.ultramic.2019.112858
ISSN
0304-3991