Prospects for analyzing the electronic properties in nanoscale systems by VEELS
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Valence electron energy-loss spectroscopy in the scanning transmission electron microscope can provide detailed information on the electronic structure of individual nanostructures. By employing the latest advances in electron optical devices, such as a probe aberration corrector and an electron monochromator, the probe size, spectroscopic resolution, probe current and primary electron energy can be varied over a large range. This flexibility is particularly important for nanostructures where each of these variables needs to be carefully counterbalanced in order to collect spectroscopic data without altering the integrity of the sample. Here the implementation of valence electron energy-loss spectroscopy to the study of nanostructures is discussed, with particular mention to the theoretical understanding of each of the contributions to the overall spectrum.
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