Journal article
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy
Abstract
New experiments made possible with a commercial transmission electron microscope (TEM) equipped with a high-resolution electron energy loss spectrometer (EELS) are presented. With this commercial system, a 100 meV energy resolution using a sub 2 nm probe or 500 meV at a 0.20 nm probe are possible, in combination with other modern techniques available for TEMs. In this paper a number of explorative examples of the first results are shown. The …
Authors
Lazar S; Botton GA; Wu M-Y; Tichelaar FD; Zandbergen HW
Journal
Ultramicroscopy, Vol. 96, No. 3-4, pp. 535–546
Publisher
Elsevier
Publication Date
September 2003
DOI
10.1016/s0304-3991(03)00114-1
ISSN
0304-3991