Journal article
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques
Abstract
Nowadays, aberration corrected transmission electron microscopy (TEM) is a popular method to characterise nanomaterials at the atomic scale. Here, atomically resolved images of nanomaterials are acquired, where the contrast depends on the illumination, imaging and detector conditions of the microscope. Visualization of light elements is possible when using low angle annular dark field (LAADF) STEM, annular bright field (ABF) STEM, integrated …
Authors
Gauquelin N; van den Bos KHW; Béché A; Krause FF; Lobato I; Lazar S; Rosenauer A; Van Aert S; Verbeeck J
Journal
Ultramicroscopy, Vol. 181, , pp. 178–190
Publisher
Elsevier
Publication Date
October 2017
DOI
10.1016/j.ultramic.2017.06.002
ISSN
0304-3991