Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
Relation between sampling, sensitivity and...
Journal article

Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy

Abstract

The sensitivity and the precision of the Geometric Phase Analysis (GPA) method for strain characterization is a topic widely discussed in the literature and is usually difficult to quantify. Indeed, the GPA precision is intricately linked to the resolution of the strain maps defined when masking the periodic reflections in Fourier space. In this study an additional parameter, sampling, is proposed to be analyzed regarding the precision of GPA …

Authors

Pofelski A; Zhu Y; Botton GA

Journal

Ultramicroscopy, Vol. 255, ,

Publisher

Elsevier

Publication Date

January 2024

DOI

10.1016/j.ultramic.2023.113842

ISSN

0304-3991