Journal article
Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM
Abstract
By forming a small electron probe in a scanning transmission electron microscope equipped with a high-angle annular dark-field (HA-ADF) detector, the Bi-O atomic planes in Bi2Sr2CaCu2O(8+delta) (Bi-2212) can be directly observed with the incoherent Z-contrast imaging technique. Using a combination of electron energy loss spectroscopy (EELS) and HA-ADF imaging, we were able to detect the Ca signals from individual Ca atomic planes in this …
Authors
Zhu Y; Niewczas M; Couillard M; Botton GA
Journal
Ultramicroscopy, Vol. 106, No. 11-12, pp. 1076–1081
Publisher
Elsevier
Publication Date
October 2006
DOI
10.1016/j.ultramic.2006.04.022
ISSN
0304-3991