Journal article
Electron inelastic scattering and anisotropy: The two-dimensional point of view
Abstract
The measurement of the electronic structure of anisotropic materials using energy loss near edge structure (ELNES) spectroscopy is an important field of microanalysis in transmission electron microscopy. We present a novel method to study the angular dependence of electron inelastic scattering in anisotropic materials. This method has been applied to the study of 1s-->pi* and sigma* transitions on the carbon K edge in pyrolitic graphite. An …
Authors
Radtke G; Botton GA; Verbeeck J
Journal
Ultramicroscopy, Vol. 106, No. 11-12, pp. 1082–1090
Publisher
Elsevier
Publication Date
October 2006
DOI
10.1016/j.ultramic.2006.04.023
ISSN
0304-3991