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Electron inelastic scattering and anisotropy: The...
Journal article

Electron inelastic scattering and anisotropy: The two-dimensional point of view

Abstract

The measurement of the electronic structure of anisotropic materials using energy loss near edge structure (ELNES) spectroscopy is an important field of microanalysis in transmission electron microscopy. We present a novel method to study the angular dependence of electron inelastic scattering in anisotropic materials. This method has been applied to the study of 1s-->pi* and sigma* transitions on the carbon K edge in pyrolitic graphite. An excellent agreement between experimental and theoretical two-dimensional scattering patterns has been found. In particular, the need of a fully relativistic calculation of the inelastic scattering cross-section to explain the experimental results is demonstrated.

Authors

Radtke G; Botton GA; Verbeeck J

Journal

Ultramicroscopy, Vol. 106, No. 11-12, pp. 1082–1090

Publisher

Elsevier

Publication Date

October 1, 2006

DOI

10.1016/j.ultramic.2006.04.023

ISSN

0304-3991

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