Review of Scientific Instruments Journal

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Control and acquisition systems for new scanning transmission x-ray microscopes at Advanced Light Source (abstract) 2002
A novel method to characterize photorefractive damage in quasiphase-matched wavelength converters 2000
Measure for optical robustness of directly bonded glass-to-glass joint using its interaction with damage induced by fs laser. 95:063004. 2024
CO2-mineralization and carbonation reactor rig: Design and validation for in situ neutron scattering experiments—Engineering and lessons learned. 94:093905. 2023
Input polarization-independent polarization-sensitive optical coherence tomography using a depolarizer. 91:043706. 2020
Cryo scanning transmission x-ray microscope optimized for spectrotomography. 89:093704. 2018
Instrumentation for in situ flow electrochemical Scanning Transmission X-ray Microscopy (STXM). 89:063702. 2018
Distortion correction and cross-talk compensation algorithm for use with an imaging spectrometer based spatially resolved diffuse reflectance system. 87:123112. 2016
Note: Benign and reproducible preparation of titanium tips. 85:026113. 2014
A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals. 84:123905. 2013
Note: Electrochemical etching of silver tips in concentrated sulfuric acid. 84:026109. 2013
The on-line charge breeding program at TRIUMF's Ion Trap For Atomic and Nuclear Science for precision mass measurements. 83:02A912. 2012
Time-resolved one-dimensional detection of x-ray scattering in pulsed magnetic fields. 83:013113. 2012
Spectral-domain phase microscopy with improved sensitivity using two-dimensional detector arrays. 82:023706. 2011
Note: Characterization of electrode materials for dielectric spectroscopy. 81:016104. 2010
A portable high-field pulsed-magnet system for single-crystal x-ray scattering studies. 80:113902. 2009
A high-precision apparatus for the characterization of thermal interface materials. 80:095111. 2009
Multichannel digital phase sensitive detection using a field programmable gate array development platform. 79:074702. 2008
Separated two-phase flow regime parameter measurement by a high speed ultrasonic pulse-echo system. 78:114901. 2007
Model, prediction, and experimental verification of composition and thickness in continuous spread thin film combinatorial libraries grown by pulsed laser deposition. 78:072203. 2007
In situ azimuthal rotation device for linear dichroism measurements in scanning transmission x-ray microscopy. 78:033703. 2007
Recrystallization of tungsten wire for fabrication of sharp and stable nanoprobe and field-emitter tips. 78:026104. 2007
Piezoelectric trace vapor calibrator. 77. 2006
Laser photoluminescence spectrometer based on charge-coupled device detection for silicon-based photonics. 77. 2006
Bolometric technique for high-resolution broadband microwave spectroscopy of ultra-low-loss samples. 75:124-135. 2004
Time-domain laser-induced fluorescence spectroscopy apparatus for clinical diagnostics. 75:151-162. 2004
Differential pressure experiment to probe hole growth in freely standing polymer films. 74:2796-2804. 2003
Controlling probe-sample separation with aerodynamic floating. 72:3576-3579. 2001
Capacitance based scanner for thickness mapping of thin dielectric films. 71:2219-2223. 2000
A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source. 69:2964-2973. 1998
Averaging and recording of digital deep-level transient spectroscopy transient signals. 69:2464-2474. 1998
Magnetic susceptibility measurements of ultrathin films using the surface magneto-optic Kerr effect: Optimization of the signal-to-noise ratio. 68:4212-4216. 1997
One-dimensional position-sensitive superheated-liquid-droplet in-phantom neutron dosimeter. 66:5442-5449. 1995
Flexure-mounted external cavity for single-mode operation of semiconductor diode lasers. 66:4458-4460. 1995
Simple window-compensation method for improving the signal-to-noise ratio in measurements of the magneto-optic Kerr effect in ultrathin films. 66:3280-3283. 1995
Simple, calibrated deposition monitor incorporated into an electron beam evaporator. 64:2008-2012. 1993
Electron polarimeter based on spin-polarized low-energy electron diffraction. 62:2409-2418. 1991
Short-external-cavity module for enhanced single-mode tuning of InGaAsP and AlGaAs semiconductor diode lasers. 62:2385-2388. 1991
Sample holder allowing precise orientation, azimuthal rotation, and high temperature flashes in ultrahigh vacuum. 62:1361-1364. 1991
Ultrasonic system for the detection of transient liquid/gas interfaces using the pulse-echo technique. 57:1661-1666. 1986
Single-crystal silicon high-Q torsional oscillators. 56:2088-2091. 1985
Sample positioner and deflection energy analyzer for measurements of photofield emission. 56:1206-1211. 1985
New high-performance electron energy loss spectrometer for valence and inner-shell excitation studies. 55:182-191. 1984
Ultrahigh vacuum apparatus for combined low-energy electron diffraction, Auger spectroscopy, MeV ion scattering, and nuclear microanalysis. 53:797-802. 1982
Microprocessor-based, programmable laboratory equipment controller and data acquisition system. 49:1551-1556. 1978
Picosecond-resolution fluorescence lifetime measuring system with a cw laser and a radio. 49:39-44. 1978
A Computer Controlled Automatic System for Measuring the Conductivity and Hall Effect in Semiconducting Samples. 42:1797-1807. 1971
A Compact 3He Cryostat Using Activated Charcoal. 42:1265-1266. 1971
Design and Trajectories for a Magnetic Lens Nuclear Spectrometer. 24:1145-1146. 1953

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