Journal article
A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
Abstract
Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.
Authors
Warwick T; Franck K; Kortright JB; Meigs G; Moronne M; Myneni S; Rotenberg E; Seal S; Steele WF; Ade H
Journal
Review of Scientific Instruments, Vol. 69, No. 8, pp. 2964–2973
Publisher
AIP Publishing
Publication Date
August 1, 1998
DOI
10.1063/1.1149041
ISSN
0034-6748