publication venue for
- Summary Abstract: Surface phases of clean, CO and NO covered Pt(110) 1982
- Auger and x‐ray characterization of surface nitride films on Ti, Zr, and Hf. 21:36-41. 1982
- The preparation and characterization of transition metal nitride films. 20:966-967. 1982
- AUGER AND X-RAY CHARACTERIZATION OF SURFACE NITRIDE FILMS ON TI, ZR, AND HF.. V 21:36-41. 1982
- Preferential sputtering and surface segregation in tungsten–molybdenum alloys. 18:529-532. 1981
- Stability and reactivity of (5×20) and (1×1) Pt(100) surfaces. 17:149-153. 1980
- Radiation effects in MOS devices caused by x-ray and e-beam lithography. 16:1658-1661. 1979