publication venue for
- LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm. 21:338-347. 2021
- Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification. 8:484-489. 2008
- Effects of hot-carrier stress on the performance of CMOS low-noise amplifiers. 5:501-508. 2005