Journal article
LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm
Abstract
Authors
Enayati J; Rahimnejad A; Gadsden SA
Journal
IEEE Transactions on Device and Materials Reliability, Vol. 21, No. 3, pp. 338–347
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2021
DOI
10.1109/tdmr.2021.3095244
ISSN
1530-4388