Journal article
Degradation Mechanisms of Au–Al Wire Bonds During Qualification Tests at High Temperature for Automotive Applications: Quality Improvement by Process Modification
Abstract
Authors
Bahi MA; Lecuyer P; Gentil A; Fremont H; Landesman J-P; Christien F; Le Gall R
Journal
IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 3, pp. 484–489
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2008
DOI
10.1109/tdmr.2008.2001703
ISSN
1530-4388