ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Journal

publication venue for

• A general procedure for high-frequency noise parameter de-embedding of MOSFETs by taking the capacitive effects of metal interconnections into account 2001
• Effects of electrical stress on the frequency performance of 0.18 μm technology NMOSFETs 2001
• Extraction of the induced gate noise, channel thermal noise and their correlation in sub-micron MOSFETs from RF noise measurements 2001