Extraction of the induced gate noise, channel thermal noise and their correlation in sub-micron MOSFETs from RF noise measurements Conferences

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authors

Chen, Chih-hung
Chih-Hung Chen
Deen, Jamal
Matloubian, M
Yuhua Cheng

status

accepted

publication date

2001

published in

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Journal

presented at event

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures Conference