Effects of electrical stress on the frequency performance of 0.18 μm technology NMOSFETs Conferences

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authors

Naseh, S
Deen, Jamal
Marinov, O

status

accepted

publication date

January 1, 2001

published in

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Journal

presented at event

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures Conference