A general procedure for high-frequency noise parameter de-embedding of MOSFETs by taking the capacitive effects of metal interconnections into account Conferences

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authors

Chen, Chih-hung
Chih-Hung Chen
Deen, Jamal

status

accepted

publication date

January 1, 2001

published in

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Journal

presented at event

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures Conference