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Combinatorial Methodologies Applied to the Advanced CMOS Gate Stack

Abstract

As the CMOS gate stack continues to scale to smaller dimensions, new materials must be introduced into the stack to keep pace with design requirements. One way to measure the properties of new materials systems is through the use of high‐throughput experimentation, called combinatorial methodology. We describe two examples of combinatorial experimental design for CMOS. In the first, we will demonstrate library design and growth of Al‐Hf‐Y‐O …

Authors

Chang K-S; Bassim ND; Schenck PK; Suehle J; Takeuchi I; Green ML; Seiler DG; Diebold AC; McDonald R; Garner CM

Volume

931

Pagination

pp. 297-302

Publisher

AIP Publishing

Publication Date

September 26, 2007

DOI

10.1063/1.2799387

Name of conference

AIP Conference Proceedings

Conference proceedings

AIP Conference Proceedings

Issue

1

ISSN

0094-243X