Conference
Nanoscale investigation of extended defects in wide-bandgap semiconductors by exploiting phonon-resonant near-field interaction
Authors
Marvinney CE; Hauer B; Lewin M; Mahadik NA; Hite JK; Bassim N; Giles AJ; Stahlbusch RE; Caldwell JD; Taubner T
Publisher
SPIE, the international society for optics and photonics
Publication Date
August 20, 2020
DOI
10.1117/12.2568576
Name of conference
Enhanced Spectroscopies and Nanoimaging 2020