Onset of void coalescence studied by X-ray computed tomography

The void growth and coalescence in model materials involving a pre-existing three dimensional void array (i.e. multiple layers of a void array) was studied by X-ray computed tomography (XCT) coupled with in situ tensile deformation. To reduce the recording time, a new technique called fast tomography was employed. The model materials used in this paper were fabricated by the combination of an ultra-short pulsed laser machining system and a …