Conference
Monitoring Infrared Light using a Commercial Variable Optical Attenuator Subjected to Defect Engineering
Abstract
The fabrication of silicon-waveguide power monitors via the introduction of defects to commercially produced variable optical attenuators is demonstrated. Devices show an effective quantum efficiency of ~1% for a tapped fraction of signal of 30%.
Authors
Knights AP; Jessop PE; Bruce DM; Logan DF; Luff BJ; Zheng D; Shafiiha R; Asghari M
Pagination
pp. 85-86
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2008
DOI
10.1109/group4.2008.4638105
Name of conference
2008 5th IEEE International Conference on Group IV Photonics