Nanoscale investigation of extended defects in wide-bandgap semiconductors by exploiting phonon-resonant near-field interaction Conferences uri icon

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authors

  • Marvinney, Claire E
  • Hauer, Benedikt
  • Lewin, Martin
  • Mahadik, Nadeem A
  • Hite, Jennifer K
  • Bassim, Nabil
  • Giles, Alexander J
  • Stahlbusch, Robert E
  • Caldwell, Joshua D
  • Taubner, Thomas

publication date

  • August 20, 2020