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Structural investigation of interface and defects...
Journal article

Structural investigation of interface and defects in epitaxial Bi3.25La0.75Ti3O12 film on SrRuO3/SrTiO3 (111) and (100)

Abstract

The structure of La-doped bismuth titanate (BLT), Bi3.25La0.75Ti3O12, is investigated with atomic resolution high-angle annular dark field (HAADF) scanning transmission electron microscopy. The images reveal evidence of the tilting of TiO6 octahedra within the perovskite-like layers of the BLT unit cell. The tendency of La ions to substitute Bi ions and occupy the top part of the (Bi2O2)2+ layer, previously observed from electron energy loss …

Authors

Gunawan L; Zhu G-Z; Shao Y; Lazar S; Gautreau O; Harnagea C; Pignolet A; Botton GA

Journal

Journal of Applied Physics, Vol. 113, No. 4,

Publisher

AIP Publishing

Publication Date

January 28, 2013

DOI

10.1063/1.4775598

ISSN

0021-8979