Conference
Influence of Yield Criteria on the Prediction of Shear Localization Considering the Inhomogeneous Distribution of Microstructure
Abstract
Authors
Duan X; Metzger D; Jian M
Pagination
pp. 59-65
Publisher
ASME International
Publication Date
January 1, 2004
DOI
10.1115/pvp2004-2747
Name of conference
Computer Technology and Applications