The determination of the energy distribution of interface traps in metal-nitride-oxide-silicon (memory) devices using non-steady-state techniques
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Overview
status
publication date
- May 1976
has subject area
- 0204 Condensed Matter Physics (FoR)
- 0205 Optical Physics (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- Applied Physics (Science Metrix)
published in
- Solid-State Electronics Journal