Journal of Electronic Testing: Theory and Applications (JETTA) Journal

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publication venue for

Guest Editorial. 24:325-326. 2008
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy. 24:393-403. 2008
Testability Trade-Offs for BIST Data Paths. 20:169-179. 2004

has subject area

0906 Electrical and Electronic Engineering (FoR)
Computer Hardware & Architecture (Science Metrix)