Testability Trade-Offs for BIST Data Paths Journal Articles

authors

• Nicolici, Nicola
• Al-Hashimi, Bashir M

status

• published 

publication date

• April 2004

has subject area

• 0906 Electrical and Electronic Engineering (FoR)
• Computer Hardware & Architecture (Science Metrix)

published in

• Journal of Electronic Testing: Theory and Applications (JETTA)  Journal

keywords

• BIST
• CIRCUITS
• DESIGN
• Engineering
• Engineering, Electrical & Electronic
• HIGH-LEVEL SYNTHESIS
• MANAGEMENT
• MINIMIZATION
• POWER DISSIPATION
• SCAN
• Science & Technology
• Technology
• power-constrained test

Digital Object Identifier (DOI)

• 10.1023/b:jett.0000023680.46155.65

start page

• 169

end page

• 179

volume

• 20

issue

• 2