Journal article
Testability Trade-Offs for BIST Data Paths
Abstract
Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation.
Authors
Nicolici N; Al-Hashimi BM
Journal
Journal of Electronic Testing, Vol. 20, No. 2, pp. 169–179
Publisher
Springer Nature
Publication Date
4 2004
DOI
10.1023/b:jett.0000023680.46155.65
ISSN
0923-8174