publication venue for
- PREFACE: CMOS RF MODELING, CHARACTERIZATION AND APPLICATIONS. 11:iii-vii. 2001
- RF CMOS NOISE CHARACTERIZATION AND MODELING. 11:1085-1157. 2001
- RF CMOS RELIABILITY. 11:1249-1295. 2001
International Journal of High Speed Electronics and Systems
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- Applied Physics (Science Metrix)