Conference
Evaluation of localized area epitaxy by spectrally resolved scanning photoluminescence
Authors
Nuban MF; Krawczyk SK; Buchheit M; Blanchet RC; Nagy SC; Robinson BJ; Thompson DA; Simmons JG
Editors
Mickleson AR
Series
INSTITUTE OF PHYSICS CONFERENCE SERIES
Volume
149
Pagination
pp. 251-256
Publisher
IOP PUBLISHING LTD
Publication Date
January 1, 1996
ISBN-10
0-7503-0372-7
Name of conference
Defect Recognition and Image Processing in Semiconductors 1995 Conference (DRIP VI)
Conference place
BOULDER, CO
Conference start date
December 3, 1995
Conference end date
December 6, 1995
Conference proceedings
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995
ISSN
0951-3248