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Design Considerations for Spin Readout Amplifiers...
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Design Considerations for Spin Readout Amplifiers in Monolithically Integrated Semiconductor Quantum Processors

Abstract

The high frequency performance of all active and passive devices in a production 22nm FDSOI CMOS technology was measured up to 40 GHz over temperature down to 3.3 Kelvin, targeting applications in cryogenic and quantum computing ICs. It was found that the quality factor of the passives and the fT and fMAX of both p- and n-MOSFETs improved at 3.3 K. More importantly for circuit design, the peakfT and peak-fMAX current densities, and the MOM capacitor and polysilicon resistor values show no variance with temperature. This information and the measured I-V characteristics of electron and hole single- and double-quantum dot structures, measured at 2 K and representative of qubits, were used to design monolithically integrated double quantum dots with readout transimpedance amplifiers output matched to 50 Ω. Transimpedance gain, S21, and bandwidth of 108 dBΩ, 19 dB, and 7.5 GHz, respectively, were measured at 300 K with only 4.5 mW power consumption and S22 < -10 dB up to 60 GHz.

Authors

Gong MJ; Alakusu U; Bonen S; Dadash MS; Lucci L; Jia H; Gutierrez LE; Chen WT; Daughton DR; Adam GC

Pagination

pp. 111-114

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

June 1, 2019

DOI

10.1109/rfic.2019.8701847

Name of conference

2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

Conference proceedings

2008 IEEE Radio Frequency Integrated Circuits Symposium

ISSN

1529-2517

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Design Considerations for Spin Readout Amplifiers...