Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes

Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows the experimenter to obtain failure data more quickly at increased stress levels than under normal operating conditions. A step-stress model is one special class of ALT, and in this article we consider a simple step-stress model under the cumulative exposure model with lognormally distributed lifetimes in the presence of Type-I censoring. We then discuss inferential methods for the unknown parameters of the model by the maximum likelihood estimation method. Some numerical methods, such as the Newton–Raphson and quasi-Newton methods, are discussed for solving the corresponding non-linear likelihood equations. Next, we discuss the construction of confidence intervals for the unknown parameters based on (i) the asymptotic normality of the maximum likelihood estimators (MLEs), and (ii) parametric bootstrap resampling technique. A Monte Carlo simulation study is carried out to examine the performance of these methods of inference. Finally, a numerical example is presented in order to illustrate all the methods of inference developed here.