Journal article
In Situ Transmission Electron Microscopy of GaN pn Diode Degradation
Authors
Twigg ME; Picard Y; Bassim N; Mastro M; Eddy C; Henry R; Holm R
Journal
ECS Meeting Abstracts, Vol. MA2007-02, No. 26, pp. 1345–1345
Publisher
The Electrochemical Society
Publication Date
September 28, 2007
DOI
10.1149/ma2007-02/26/1345
ISSN
2151-2043