Conference
Improving Test Generation under Rich Contracts by Tight Bounds and Incremental SAT Solving
Abstract
We present a novel and general technique for automated test generation that combines tight bounds with incremental SAT solving. The proposed technique uses incremental SAT to build test suites targeting a specific testing criterion, amongst various black-box and white-box criteria. As our experimental results show, the combination of tight bounds with incremental SAT, and the testing criterion driven approach implemented in our prototype tool …
Authors
Abad P; Aguirre N; Bengolea V; Ciolek D; Frias MF; Galeotti J; Maibaum T; Moscato M; Rosner N; Vissani I
Pagination
pp. 21-30
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2013
DOI
10.1109/icst.2013.46
Name of conference
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation