Conference
A Call Graph Mining and Matching Based Defect Localization Technique
Abstract
Authors
Yousefi A; Wassyng A
Pagination
pp. 86-95
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2013
DOI
10.1109/icstw.2013.17
Name of conference
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops