Conference
A Call Graph Mining and Matching Based Defect Localization Technique
Abstract
Locating defects in the source code of a software system is one of the most challenging tasks in software debugging. Defect localization tools aim to assist developers in finding the location of defects. Both static and dynamic analysis approaches are used. In the case of dynamic approaches, two different scenarios apply. The first is one in which we have multiple (different) executions that exhibit the faulty behavior. The second is one in …
Authors
Yousefi A; Wassyng A
Pagination
pp. 86-95
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2013
DOI
10.1109/icstw.2013.17
Name of conference
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops