Conference
Capacity and reliability analyses with applications to power quality
Authors
Azam M; Tu F; Shlapak Y; Kirubarajan T; Pattipati KR; Karanam R
Volume
4389
Pagination
pp. 81-92
Publisher
SPIE, the international society for optics and photonics
Publication Date
July 20, 2001
DOI
10.1117/12.434255
Name of conference
Component and Systems Diagnostics, Prognosis, and Health Management
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X