Sensitivity-Based Quantitative Imaging Using Planar Raster Scanning

A quantitative imaging method based on the self-adjoint sensitivity analysis of S-parameters is proposed. The estimation of the medium complex dielectric permittivity is achieved in real time. The method requires the measurement of two objects as part of the system calibration: a reference and a calibration object. The method is validated with simulation examples based on a planar raster-scanning acquisition.