Home
Scholarly Works
Soft x-ray projection lithography
Journal article

Soft x-ray projection lithography

Abstract

This article examines soft x-ray projection lithography (SXPL) as a potential late 1990's technology for the mass production of ICs with 0.1 μm features. Synchrotron radiation and laser generated plasma x-ray sources may both be suitable for volume production. Reflecting optics are required for projection lithography in the 13 to 16 nm range. Building a projection camera will require advances in mirror blank fabrication, multilayer film techniques for high reflectivity coatings, x-ray metrology, and alignment systems.

Authors

White DL; Bjorkholm JE; Bokor J; Eichner L; Freeman RR; Jewell TE; Mansfield WM; MacDowell AA; Szeto LH; Taylor DW

Journal

Solid State Technology, Vol. 34, No. 7, pp. 37–42

Publication Date

July 1, 1991

ISSN

0038-111X

Contact the Experts team