Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
Removal of Titanium Oxide Grown on Titanium...
Conference

Removal of Titanium Oxide Grown on Titanium Nitride and Reduction of Via Contact Resistance Using a Modern Plasma Asher

Abstract

In making multi-level interconnects, a via layer is generally made of a dielectric layer grown on a TiN/AlSiCu/TiN metal stack. The via contact hole to the lower level metal is first etched after metal patterning and intermetal oxide deposition, then the resist mask for via etch is stripped in an oxygen plasma at high temperature before filling the via with tungsten or aluminum. However, during the resist stripping process, the titanium nitride …

Authors

Boumerzoug M; Xu H; Bersin R; Mascher P; Balcaitis G

Volume

495

Pagination

pp. 345-352

Publisher

Springer Nature

Publication Date

12 1997

DOI

10.1557/proc-495-345

Conference proceedings

MRS Online Proceedings Library

Issue

1

ISSN

0272-9172

Labels