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Scanning photoluminescence technique to determine...
Journal article

Scanning photoluminescence technique to determine the phase of the grating at the facets of gain-coupled DFB's

Abstract

We demonstrate a rapid, nondestructive scanning photoluminescence (PL) technique for the determination of the phase of the grating at the cleaved or coated facets of "in-phase" gain-coupled distributed feedback lasers. The measured phases of the grating at the cleaved facets of a bar of lasers are found to be consistent with experimental measurements of laser performance.

Authors

Adams DM; Cassidy DT; Bruce DM

Journal

IEEE Journal of Quantum Electronics, Vol. 32, No. 7, pp. 1237–1242

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

7 1996

DOI

10.1109/3.517024

ISSN

0018-9197