Conference
Defect mediated detection of wavelengths around 1550 nm in a ring resonant structure
Authors
Knights AP; Doylend JK; Logan DF; Ackert JJ; Jessop PE; Velha P; Sorel M; De La Rue RM
Volume
7943
Publisher
SPIE, the international society for optics and photonics
Publication Date
February 10, 2011
DOI
10.1117/12.874018
Name of conference
Silicon Photonics VI
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X