Conference
Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results
Abstract
The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design …
Authors
Kaznatcheev KV; Karunakaran C; Lanke UD; Urquhart SG; Obst M; Hitchcock AP
Volume
582
Pagination
pp. 96-99
Publisher
Elsevier
Publication Date
November 2007
DOI
10.1016/j.nima.2007.08.083
Conference proceedings
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
Issue
1
ISSN
0168-9002