Conference
Combinatorial Methodologies Applied to the Advanced CMOS Gate Stack
Abstract
As the CMOS gate stack continues to scale to smaller dimensions, new materials must be introduced into the stack to keep pace with design requirements. One way to measure the properties of new materials systems is through the use of high‐throughput experimentation, called combinatorial methodology. We describe two examples of combinatorial experimental design for CMOS. In the first, we will demonstrate library design and growth of Al‐Hf‐Y‐O …
Authors
Chang K-S; Bassim ND; Schenck PK; Suehle J; Takeuchi I; Green ML; Seiler DG; Diebold AC; McDonald R; Garner CM
Volume
931
Pagination
pp. 297-302
Publisher
AIP Publishing
Publication Date
September 26, 2007
DOI
10.1063/1.2799387
Name of conference
AIP Conference Proceedings
Conference proceedings
AIP Conference Proceedings
Issue
1
ISSN
0094-243X