Conference
TLM: A Robust Tool for Electromagnetics-based Optimization
Abstract
Authors
Bakr M; Bandler J; Nikolova N
Volume
1
Pagination
pp. 145-148
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2012
DOI
10.1109/apemc.2012.6237909
Name of conference
2012 Asia-Pacific Symposium on Electromagnetic Compatibility