Conference
Measurement of MR Gradient Effects in CZT Detectors Used in a SPECT/MRI System
Abstract
Authors
Reimers E; Chronik B; Noseworthy M; Konyer N; Farncombe T
Volume
00
Pagination
pp. 1-6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 7, 2020
DOI
10.1109/nss/mic42677.2020.9507851
Name of conference
2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)