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Quantitative analysis of buried interfacial impurity layers by SIMS and RBS
Journal Articles
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Research
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Additional Document Info
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Overview
authors
Williams, Peter
Baker, Judith E
Davies, John Arthur
Jackman, Tom E
status
published
publication date
December 1981
published in
Nuclear Instruments & Methods in Physics Research
Journal
Research
keywords
Instruments & Instrumentation
Nuclear Science & Technology
Science & Technology
Technology
Identity
Digital Object Identifier (DOI)
10.1016/0029-554x(81)91022-3
Additional Document Info
start page
318
end page
322
volume
191
issue
1-3