publication venue for
- Absolute calibration of 14N(d, α) and 14N(d, p) reactions for surface adsorption studies. 218:141-146. 1983
- Auger electron emission induced by MeV H+ and He+ ions. 218:765-770. 1983
- Intercomparison of absolute standards for RBS studies. 218:147-148. 1983
- Precision standard reference targets for microanalysis by nuclear reactions. 218:177-182. 1983
- Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standards. 218:299-302. 1983
- An automated background estimation procedure for gamma ray spectra. 216:205-218. 1983
- Evaluation of a method for the determination of accurate transition energies in the (n, γ) reaction. 215:159-165. 1983
- Incremental deconvolution I algorithm development and assessment. 203:317-327. 1982
- A test of the feasibility of γp-coincidence techniques in conjunction with the (t, pγ) reaction. 193:495-497. 1982
- Temperature dependence and the surface peaks in MeV ion backscattering spectra. 194:143-146. 1982
- The factors affecting in vivo x-ray fluorescence measurements of lead in bone. 193:377-382. 1982
- An experimental study of the 180° backscattering yield enhancement. 191:527-531. 1981
- Automated analysis for high energy gamma ray spectra. 190:313-323. 1981
- Large angle differential scattering cross-sections for various ions (2 ⩽ Z1 ⩽ 10) in the 65–135 keV energy range. 191:495-499. 1981
- Quantitative analysis of buried interfacial impurity layers by SIMS and RBS. 191:318-322. 1981
- Stopping powers for 20–140 keV H+ and He+ on Ni, Ag and Au. 191:469-474. 1981
- A simple ultrasoft X-ray calibration source. 188:477-480. 1981
- Determination of the thermal radiative capture cross section of 14N. 188:243-245. 1981
- Experimental study of the enhanced ion backscattering yield at 180° and its depth dependence. 185:459-468. 1981