Precision measurements of 20Na, 24Al, 28P, 32Cl, and 36K for the rp-process Conference Paper uri icon

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authors

  • Wrede, C
  • Clark, JA
  • C.m. Deibel, CM
  • Faestermann, T
  • Hertenberger, R
  • Parikh, A
  • Wirth, HF
  • Bishop, S
  • Chen, Alan
  • Eppinger, K
  • Freeman, BM
  • García, A
  • Krücken, R
  • Lepyoshkina, O
  • Rugel, G
  • Setoodehnia, K

publication date

  • December 1, 2010