Conference
A hidden Markov model based algorithm for online fault diagnosis with partial and imperfect tests
Abstract
Authors
Ying J; Kirubarajan T; Pattipati KR; Deb S
Pagination
pp. 355-366
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 1999
DOI
10.1109/autest.1999.800402
Name of conference
1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323)
Conference proceedings
1999 IEEE AUTOTESTCON Proceedings (Cat No99CH36323)