Journal article
A novel test-cost-sensitive attribute reduction approach using the binary bat algorithm
Abstract
Authors
Xie X; Qin X; Zhou Q; Zhou Y; Zhang T; Janicki R; Zhao W
Journal
Knowledge-Based Systems, Vol. 186, ,
Publisher
Elsevier
Publication Date
December 15, 2019
DOI
10.1016/j.knosys.2019.104938
ISSN
0950-7051