Journal article
Field Test of Measurement-Device-Independent Quantum Key Distribution
Abstract
Authors
Tang Y-L; Yin H-L; Chen S-J; Liu Y; Zhang W-J; Jiang X; Zhang L; Wang J; You L-X; Guan J-Y
Journal
IEEE Journal of Selected Topics in Quantum Electronics, Vol. 21, No. 3, pp. 116–122
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2015
DOI
10.1109/jstqe.2014.2361796
ISSN
1077-260X